I am looking for the advice regarding the modelling of the results of a working (short-term) memory test. In a typical case, performance in such tests can be characterized using the hit rate and false alarm rate, which can be nicely combined into d-prime, and the reaction time. My question is whether there are smart concepts how all these parameters may be fused together to generate some sort of the "working memory performance index"? (Toy example: d-prime that is weighted by the log-transformed reaction time.) Any references will be very much appreciated.
Upd: I am interesting in the specific application and possible specific pitfalls for the working memory research.